Vine leaf
Characterizing sweet potato powders
Nov 25
These images illustrate the ease of inspection of a closed microchip, to see the electronic circuit or wire connections, and to inspect these for possible short circuits or to locate defect regions.
3D X-ray, X-ray microscopy, X-ray tomography, microCT, Industrial CT, Nondestructive testing, Metrology: Services South Africa & International
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